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The Filmetrics^? F20, F40 and F3-CS Thin-Film Analyzers are used for thickness and uniformity measurement of parylene coatings, which are widely used in the biomedical industry due to their unique properties.

The Filmetrics^? F20 and F40 Thin-Film Analyzers use spectral reflectance technology for layer thickness measurement of different types of coatings used on medical devices. This discussion includes thickness measurement of a pharmacological coating on a medical stent, thickness of a polymer wire coating, and angioplasty balloon wall thickness.

The Filmetrics^? F10-RT-UVX was used to measure a multilayer dielectric stack of unknown materials, resolving not only the number of layers and the index of refraction of the high index material, but the thickness of each individual layer.

The Filmetrics^? F10-RT Thin-Film Analyzer was used to measure the index of refraction of graphene, using the simultaneous capture of reflectance and transmittance spectra. The F50 thin film mapping tool was used to measure and map graphene monolayer and bilayer uniformity across an entire wafer.